Reliability Tools

P Diagram Generator

Build signal/control/noise/outputs P-Diagrams with inline editing, presets, and SVG/PNG/PDF export.

P-Diagram\boxed{\text{P-Diagram}}
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Reliability Block Diagram (RBD) Generator

Build reliability block diagrams from a table, compute Series/Parallel reliability, and export SVG/CSV diagrams.

Rsys=1−∇(1−Ri)R_{sys} = 1 - \nabla (1 - R_i)
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Arrhenius Calculator

Calculate acceleration factor (AF) using the Arrhenius equation.

AF=e(Eak(1Tuse−1Tstress))AF = e^{\left(\frac{E_a}{k} \left(\frac{1}{T_{\text{use}}} - \frac{1}{T_{\text{stress}}} \right)\right)}
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Coffin-Manson Calculator

Estimate fatigue life under cyclic thermal loading.

Nf=A⋅Δε−cN_f = A \cdot \Delta\varepsilon^{-c}
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Sample Size Calculator

Determine required sample size or reliability/confidence using the binomial distribution.

1−∑i=0f(ni)(1−R)iRn−i≥CL1 - \sum_{i=0}^{f} \binom{n}{i} (1 - R)^i R^{n - i} \geq CL
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Electromigration Lifetime Calculator

Estimate the Mean Time to Failure (MTTF) of microelectronics using Black's equation.

MTTF=A⋅j−n⋅eEakTMTTF = A \cdot j^{-n} \cdot e^{\frac{E_a}{kT}}
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Burn-In Test Wizard

Interactive wizard to recommend optimal Burn-In test conditions and duration for early-life failure detection in semiconductors.

AF=eEak(1Tuse−1Tstress)AF = e^{\frac{E_a}{k} \left( \frac{1}{T_{use}} - \frac{1}{T_{stress}} \right)}
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Test Plan Generator

Generate test plan

Test Plan Generator\boxed{\text{Test Plan Generator}}
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Bayesian Reliability Predictor (Software)

Software Reliability

Bayesian Prediction\boxed{\text{Bayesian Prediction}}
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Psychrometric calculator

Psychrometric calculator

Psychrometric calculator\boxed{\text{Psychrometric calculator}}
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Derating Navigator

Apply MIL-style derating rules to electronic and mechanical components, compute derated DM/FOS, thermal margins, and generate compliance summaries and exports.

DM=1−AppliedRated\boxed{DM = 1 - \frac{\text{Applied}}{\text{Rated}}}
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